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Thin-film filter design The filter response design goal (Fig. S3(a)) used in this work is realized by conventional thin-film design methods. A commercial thin-film design software (Optilayer) was used to optimize a two-material thin-film stack to adequately meet the design goal. Tantalum oxide (Ta2O5) was chosen as the high index (n = 2.15) material and silicon dioxide (SiO2) was chosen as the low index (n = 1.46) material, as they are both easily deposited. The substrate was NBK7, a common optical glass. The final stack was constrained to be less than 75 total layers to keep costs down, and each layer between 10 – 500 nm to prevent stress cracks in thick films. Using these constraints in tandem with the provided filter design goal, the thin-film stack was optimized for incident angles between 0 - 10. A representative stack design produced by Optilayer for the design of Filter 2 is given in Fig. S5. The actual design for the device experimentally demonstrated in the main text was slightly modified from that of Fig. S6 by a thin-film foundry (Iridian Spectral Technologies, Ontario, Canada), though they did not share the precise thicknesses of the films with us due to their standard disclosure policy. Nevertheless, the specifics of the design are not critical as long as it implements the desired transmission spectrum (Fig. 2(b)). Comparison of CRT and LCD monitors: Figure S6: Thin-film filter stack design for filter 2 (Fig. S3(a)), using Ta2O5 (n = 2.15, blue) and SiO2 (n = 1.46, red) dielectric layers. 9PDF Image | Enhancing color vision by breaking binocular redundancy
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